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Modeling Nanowire and Double-Gate Junctionless Field-Effect Transistors
Hardback
Main Details
Title |
Modeling Nanowire and Double-Gate Junctionless Field-Effect Transistors
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Authors and Contributors |
By (author) Farzan Jazaeri
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By (author) Jean-Michel Sallese
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Physical Properties |
Format:Hardback | Pages:252 | Dimensions(mm): Height 254,Width 178 |
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Category/Genre | Nanotechnology Electronics engineering |
ISBN/Barcode |
9781107162044
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Classifications | Dewey:621.3815284 |
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Audience | Undergraduate | Postgraduate, Research & Scholarly | |
Illustrations |
7 Tables, black and white; 5 Halftones, black and white; 117 Line drawings, black and white
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Publishing Details |
Publisher |
Cambridge University Press
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Imprint |
Cambridge University Press
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Publication Date |
1 March 2018 |
Publication Country |
United Kingdom
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Description
The first book on the topic, this is a comprehensive introduction to the modeling and design of junctionless field effect transistors (FETs). Beginning with a discussion of the advantages and limitations of the technology, the authors also provide a thorough overview of published analytical models for double-gate and nanowire configurations, before offering a general introduction to the EPFL charge-based model of junctionless FETs. Important features are introduced gradually, including nanowire versus double-gate equivalence, technological design space, junctionless FET performances, short channel effects, transcapacitances, asymmetric operation, thermal noise, interface traps, and the junction FET. Additional features compatible with biosensor applications are also discussed. This is a valuable resource for students and researchers looking to understand more about this new and fast developing field.
Author Biography
Farzan Jazaeri is a Scientist at the Ecole Polytechnique Federale de Lausanne where his research interests focus on semiconductor devices and physics, and particularly the modeling and fabrication of field-effect transistors. Jean-Michel Sallese is a Senior Scientist at the Ecole Polytechnique Federale de Lausanne. He specialises in the analytical modeling of bulk and multigate field-effect transistors.
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