Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials: Volume 1184

Paperback / softback

Main Details

Title Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials: Volume 1184
Authors and Contributors      Edited by Peter Moeck
Edited by Sven Hovmoeller
Edited by Stavros Nicolopoulos
Edited by Sergei Rouvimov
Edited by Valeri Petkov
SeriesMRS Proceedings
Physical Properties
Format:Paperback / softback
Pages:228
Dimensions(mm): Height 229,Width 152
Category/GenreMaterials science
ISBN/Barcode 9781107408203
ClassificationsDewey:620.115
Audience
Postgraduate, Research & Scholarly
Professional & Vocational

Publishing Details

Publisher Cambridge University Press
Imprint Cambridge University Press
Publication Date 5 June 2014
Publication Country United Kingdom

Description

This book combines the proceedings of Symposium GG, Electron Crystallography for Materials Research, and Symposium HH, Quantitative Characterization of Nanostructured Materials, both from the 2009 MRS Spring Meeting in San Francisco. Papers from Symposium GG focus on the fundamentals and recent progress in electron crystallography and associated strategies for structural fingerprinting of nanocrystals. Some consensus was reached regarding precession electron diffraction and electron diffraction tomography as instrumental breakthroughs leading to ab initio determinations of unknowns with high structural complexity. Some of these unknowns may only exist as nanocrystals. For Symposium HH, experts in a wide variety of probing techniques come together in an effort to find optimal, and often combined, approaches for determining atomic structure at the nanoscale - the problem at the core of nanotechnology.