Surface Analysis of Polymers by XPS and Static SIMS

Description

This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.

'... an excellent introduction to the field. The book is well organised, has a good index and there are numerous diagrams and figures supporting throughout. Overall, this is a super book that will rapidly become a standard text and a must for the library of any serious surface or polymer group.' Martyn C. Davies, Chemistry in Britain ' ... a useful introductory text on the subject ... The book is well produced and leads the reader clearly through the basic principles to the more subtle features of the topic. I can recommend this publication to those wishing to gain a better understanding of the way to characterise such materials using these techniques.' C. A. Finch, Polymer International ' ... the author is to be congratulated on achieving his aim of an 'in-depth' treatment of the subject matter in a concise and readable style. This is excellent value for money and is thoroughly recommended to all practising, or aspiring, surface analysts with an interest in polymers.' John F. Watts, The Analyst