High Resolution X-Ray Diffractometry And Topography

Hardback

Main Details

Title High Resolution X-Ray Diffractometry And Topography
Authors and Contributors      By (author) D. Keith Bowen
By (author) Brian K. Tanner
Physical Properties
Format:Hardback
Pages:264
Dimensions(mm): Height 248,Width 171
Category/GenreOptics
Materials science
ISBN/Barcode 9780850667585
ClassificationsDewey:548.83 548.83
Audience
Professional & Vocational

Publishing Details

Publisher Taylor & Francis Ltd
Imprint Taylor & Francis Ltd
Publication Date 5 February 1998
Publication Country United Kingdom

Description

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.