Refine Result: Format: Country of publication: Publication date: Sort results by: All Formats ( 3 ) Hardback (2)Paperback (1) All Countries ( 3 ) United Kingdom (2)United States (1) All Dates( 3 ) New this month (0)Last 3 months (0)Forthcoming releases (0) Default Price Low to high Price High to low Pub date old to new Pub date new to old		Page 1 of 1
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	Electromigration in Metals: Fundamentals to Nano-Interconnects By Paul S. Ho , Chao-Kun Hu Hardback Usually ships within 3-5 weeks
	Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics - 2009: Volume 1156 By Martin Gall , Alfred Grill Paperback / softback Usually ships within 3-5 weeks
	Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics - 2009: Volume 1156 By Martin Gall , Alfred Grill Hardback Usually ships within 3-5 weeks
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