Refine Result:

Format: Country of publication: Publication date: Sort results by:
Page 1 of 1
Displaying: 1 - 2 of 2 items.
CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

By Alexander A. Demkov , Bill Taylor
Paperback / softback
Usually ships within 3-5 weeks

CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

By Alexander A. Demkov , Bill Taylor
Hardback
Usually ships within 3-5 weeks

  Page 1 of 1