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Materials Reliability in Microelectronics II: Volume 265

Paperback / softback

Main Details

Title Materials Reliability in Microelectronics II: Volume 265
Authors and Contributors      Edited by C. V. Thompson
Edited by J. R. Lloyd
SeriesMRS Proceedings
Physical Properties
Format:Paperback / softback
Pages:344
Dimensions(mm): Height 229,Width 152
Category/GenreMaterials science
ISBN/Barcode 9781107409682
ClassificationsDewey:621.381
Audience
Postgraduate, Research & Scholarly
Professional & Vocational

Publishing Details
Publisher Cambridge University Press
Imprint Cambridge University Press
Publication Date 5 June 2014
Publication Country United Kingdom

Description

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.