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Nonlinear Circuit Simulation and Modeling: Fundamentals for Microwave Design

Hardback

Main Details

Title Nonlinear Circuit Simulation and Modeling: Fundamentals for Microwave Design
Authors and Contributors      By (author) Jose Carlos Pedro
By (author) David E. Root
By (author) Jianjun Xu
By (author) Luis Cotimos Nunes
SeriesThe Cambridge RF and Microwave Engineering Series
Physical Properties
Format:Hardback
Pages:356
Dimensions(mm): Height 253,Width 178
ISBN/Barcode 9781107140592
ClassificationsDewey:621.38132011
Audience
Professional & Vocational
Illustrations 5 Tables, black and white; 2 Halftones, black and white; 220 Line drawings, black and white

Publishing Details

Publisher Cambridge University Press
Imprint Cambridge University Press
Publication Date 14 June 2018
Publication Country United Kingdom

Description

Discover the nonlinear methods and tools needed to design real-world microwave circuits with this tutorial guide. Balancing theoretical background with practical tools and applications, it covers everything from the basic properties of nonlinear systems such as gain compression, intermodulation and harmonic distortion, to nonlinear circuit analysis and simulation algorithms, and state-of-the-art equivalent circuit and behavioral modeling techniques. Model formulations discussed in detail include time-domain transistor compact models and frequency-domain linear and nonlinear scattering models. Learn how to apply these tools to designing real circuits with the help of a power amplifier design example, which covers all stages from active device model extraction and the selection of bias and terminations, through to performance verification. Realistic examples, illustrative insights and clearly conveyed mathematical formalism make this an essential learning aid for both professionals working in microwave and RF engineering and graduate students looking for a hands-on guide to microwave circuit design.

Author Biography

Jose Carlos Pedro is a Professor of Electrical Engineering at Universidade de Aveiro, Portugal, and a Senior Researcher at Instituto de Telecomunicacoes, Portugal, and a Fellow of the IEEE. David E. Root is Keysight Research Fellow at Keysight Technologies, Inc., and a Fellow of the IEEE. He is a co-author of X-Parameters (Cambridge, 2013) and a co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (Cambridge, 2011). Jianjun Xu is Senior Device Modeling R&D Engineer at Keysight Technologies, Inc. Luis Cotimos Nunes is a radio-frequency Research Assistant at Instituto de Telecomunicacoes, Universidade de Aveiro, Portugal.

Reviews

'This is a remarkable book in every way that is important: clear, professional, and with good coverage of its subject. With the importance of nonlinearity in modern wireless circuit and system design, this book should be on every engineer's bookshelf.' Steve Maas, Nonlinear Technologies, Inc. 'A much needed foundational and pedagogical treatment of how modern nonlinear approaches include and transcend their more familiar but overly restrictive linear precursors. Presented from multiple mathematical and conceptual perspectives, this book opens the door for both a richer theoretical understanding and a more confident application to real-world design challenges confronting today's engineers.' Jay Alexander, Chief Technology Officer, Keysight Technologies 'With the advent of more powerful computers, the importance of models in almost every sphere of engineering and science has continued to grow rapidly. The promise of being able to more easily and more accurately represent the non-linear effects of the real world and therefore design higher performing products more quickly is within our grasp. But it is rare to find a book which brings together the collection of knowledge to both understand and practice the new skills required to embrace and succeed with non-linear modeling - but this one does. The use of practical examples and the many visualizations of non-linear behaviour further help to cement fundamental conclusions. While the theory is presented, the book clearly demonstrates how this can be transferred into practical application with modern CAD tools. In an age where artificial intelligence and machine learning are all in vogue, linking models to physical processes helps engineers to pinpoint and address area for improvement in the real world.' Mark Pierpoint, Senior Vice President, Keysight Technologies