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Nonlinear Circuit Simulation and Modeling: Fundamentals for Microwave Design
Hardback
Main Details
Title |
Nonlinear Circuit Simulation and Modeling: Fundamentals for Microwave Design
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Authors and Contributors |
By (author) Jose Carlos Pedro
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By (author) David E. Root
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By (author) Jianjun Xu
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By (author) Luis Cotimos Nunes
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Series | The Cambridge RF and Microwave Engineering Series |
Physical Properties |
Format:Hardback | Pages:356 | Dimensions(mm): Height 253,Width 178 |
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ISBN/Barcode |
9781107140592
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Classifications | Dewey:621.38132011 |
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Audience | Professional & Vocational | |
Illustrations |
5 Tables, black and white; 2 Halftones, black and white; 220 Line drawings, black and white
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Publishing Details |
Publisher |
Cambridge University Press
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Imprint |
Cambridge University Press
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Publication Date |
14 June 2018 |
Publication Country |
United Kingdom
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Description
Discover the nonlinear methods and tools needed to design real-world microwave circuits with this tutorial guide. Balancing theoretical background with practical tools and applications, it covers everything from the basic properties of nonlinear systems such as gain compression, intermodulation and harmonic distortion, to nonlinear circuit analysis and simulation algorithms, and state-of-the-art equivalent circuit and behavioral modeling techniques. Model formulations discussed in detail include time-domain transistor compact models and frequency-domain linear and nonlinear scattering models. Learn how to apply these tools to designing real circuits with the help of a power amplifier design example, which covers all stages from active device model extraction and the selection of bias and terminations, through to performance verification. Realistic examples, illustrative insights and clearly conveyed mathematical formalism make this an essential learning aid for both professionals working in microwave and RF engineering and graduate students looking for a hands-on guide to microwave circuit design.
Author Biography
Jose Carlos Pedro is a Professor of Electrical Engineering at Universidade de Aveiro, Portugal, and a Senior Researcher at Instituto de Telecomunicacoes, Portugal, and a Fellow of the IEEE. David E. Root is Keysight Research Fellow at Keysight Technologies, Inc., and a Fellow of the IEEE. He is a co-author of X-Parameters (Cambridge, 2013) and a co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (Cambridge, 2011). Jianjun Xu is Senior Device Modeling R&D Engineer at Keysight Technologies, Inc. Luis Cotimos Nunes is a radio-frequency Research Assistant at Instituto de Telecomunicacoes, Universidade de Aveiro, Portugal.
Reviews'This is a remarkable book in every way that is important: clear, professional, and with good coverage of its subject. With the importance of nonlinearity in modern wireless circuit and system design, this book should be on every engineer's bookshelf.' Steve Maas, Nonlinear Technologies, Inc. 'A much needed foundational and pedagogical treatment of how modern nonlinear approaches include and transcend their more familiar but overly restrictive linear precursors. Presented from multiple mathematical and conceptual perspectives, this book opens the door for both a richer theoretical understanding and a more confident application to real-world design challenges confronting today's engineers.' Jay Alexander, Chief Technology Officer, Keysight Technologies 'With the advent of more powerful computers, the importance of models in almost every sphere of engineering and science has continued to grow rapidly. The promise of being able to more easily and more accurately represent the non-linear effects of the real world and therefore design higher performing products more quickly is within our grasp. But it is rare to find a book which brings together the collection of knowledge to both understand and practice the new skills required to embrace and succeed with non-linear modeling - but this one does. The use of practical examples and the many visualizations of non-linear behaviour further help to cement fundamental conclusions. While the theory is presented, the book clearly demonstrates how this can be transferred into practical application with modern CAD tools. In an age where artificial intelligence and machine learning are all in vogue, linking models to physical processes helps engineers to pinpoint and address area for improvement in the real world.' Mark Pierpoint, Senior Vice President, Keysight Technologies
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