Optimal Reliability Design: Fundamentals and Applications

Description

Optimal Reliability Design, first published in 2000, provides a detailed introduction to systems reliability and reliability optimization. Techniques for maximizing system reliability are described, focusing on component reliability enhancement and redundancy arrangement. The authors present several case studies and show how optimization techniques are applied in practice. They also pay particular attention to finding methods that give the optimal trade-off between reliability and cost. The book begins with a review of key background material, and a discussion of a range of optimization models. The authors go on to cover optimization tools, such as heuristics, discrete optimization, nonlinear programming, mixed integer programming, optimal arrangement, and metaheuristic algorithms. They also describe the computational implementation of these tools. Many numerical examples are included, and the book contains over 180 homework exercises. It is suitable as a textbook for graduate-level courses in reliability engineering and operations research. It will also be a valuable reference for practising engineers.

'The book is a very wide-ranging and thorough treatise on the solution of difficult problems in reliability optimization. A huge field of work is covered on many and varied problems for which it is often extremely difficult to find practical solutions. The writing is clear and careful and reflects the pooled expertise of the four authors. I would recommend this book for both learning and reference.' M. Crowder, International Statistical Institute '... the book provides a detailed introduction to the fundamentals and applications of systems reliability and reliability optimisation ... I found the book excellent ... I highly recommend the book as a textbook for graduate courses in reliability engineering and operations research ... a valuable reference book for practising engineers and even for anyone seeking to know about reliability optimisation.' A. Saidane, Microelectronics Journal